15 May 2023

A unique environment for research on highly radioactive materials

Fig. 1 Fuel rod cross section  © PSI
Fig. 1 Fuel rod cross section  © PSI 

PSI has a unique (worldwide) environment for the investigation of highly radioactive / toxic materials:

  • Materials (different fuel types including ATF, very high burnup, various cladding materials, materials activated in SINQ)
  • The hot lab with advanced tools for analysis and preparation of micro-specimen
  • The large scale facilities for advanced material investigations

This unique combination on the PSI campus, allows to enables us to meet the needs of our industrial partners (Swiss power plants, fuel vendors, Research partners) for improving safety / efficiency in plants up to basic research.

One of the various analytical tools in the AHL is the shielded electron probe microanalyzer (EPMA), which is used to determine the quantitative (wt%) fission product distribution (Fig.2) across the cross-section of a pellet (Fig.1) for verification analysis of material behavior and validation of models.

Fig. 2 Fission products distribution across the pellet © PSI
Fig. 2 Fission products distribution across the pellet © PSI
Fig. 3 Microscopic pores filled with Xenon © PSI
Fig. 3 Microscopic pores filled with Xenon © PSI
Fig. 4 FIB specimen © PSI
Fig. 4 FIB specimen © PSI

 

The Xe behavior during transients/failures (LOCA, RIA) is an important safety parameter (bursting of the cladding due to overpressure) (Fig.3) and cannot be measured at the periphery with EPMA (open pores) (Fig.5). On the other hand, Xe is a neutron absorber, which has a negative effect on the efficiency of the fuel.

Fig. 5 Secondary electron © PSI
Fig. 5 Secondary electron © PSI

 

Fig. 6 Back scattered electron © PSI
Fig. 6 Back scattered electron © PSI

 

 
Fig. 7 Fuel-micro-sample © PSI
Fig. 7 Fuel-micro-sample © PSI

 

Fig. 8 Micro-specimen preparation © PSI
Fig. 8 Micro-specimen preparation © PSI

FIB X-ray mapping on the fuel sample cross-section is used to locate where a thin micro-sample (Fig.10, Fig.4) is taken for detailed analyses. Secondary Electron (SE), Back Scattered Electron (BSE), Energy-Dispersive X-ray Spectrometry (EDS), and Electron Backscattered Diffraction (EBSD) analyses (Fig.9, Fig.12) in the micro-sample optimize the locations for a more detailed investigation of Xe behavior (Fig3) on the microXAS beamline (Fig.4).

Fig. 9 EBSD © PSI
Fig. 9 EBSD © PSI

 

Fig. 10 Micro-specimen for SLS investigation © PSI
Fig. 10 Micro-specimen for SLS investigation © PSI

 

Using the same specimen (Fig.5) at the microXAS beamline more detailed analysis for Xe behavior and effect on the formation of the porosity / microstructure (Fig.6) can be studied. The same micro-sample (Fig.7) can be used to perform synchrotron light-based micro-beam X-ray diffraction (μXRD) and X-ray absorption spectroscopy (μXAS) on the microXAS beamline (Fig.11).

Fig. 11 Distance between two atoms © PSI
Fig. 11 Distance between two atoms © PSI
Fig. 12 Fuel-grains-and orientation © PSI
Fig. 12 Fuel-grains-and orientation © PSI

 

Taking into account the previous ENSI requirements and the implementation of those for FIB system approval, the tests shown above were successfully carried out as commissioning tests. After the final ENSI approval, the FIB system will allow the preparation of micro-samples and their analysis of different irradiated materials at specific locations (interfaces, anomalies, phases, ...) in the micrometer range.

Since these micro-samples have a very small volume (about 10-12 cm3) (Fig.7) and therefore have almost no activity/toxicity, they can be transported and analyzed in the large facilities for very detailed analyses.

 

Contact

Matthias Martin
PSI
matthias.martin@psi.ch

 

Roland Brütsch
PSI
roland.bruetsch@psi.ch

 

Dr. Johannes Bertsch
PSI
johannes.bertsch@psi.ch

 

Dr. Goutam Kuri
PSI
goutam.kuri@psi.ch